- Anritsu announced a LTE Category M software release for the Universal Wireless Test Set MT8870A to support RF tests of LTE Category M devices.
- The release includes Category M FDD Uplink Tx measurement software (MX887065A), Category M FDD Downlink Waveform files (MV887065A) and Fully Automatic Measurement Program, providing fast and automatic testing (Tx power, frequency, modulation accuracy, modulation sensitivity, etc.) in accordance with the 3GPP LTE Category M RF test specifications.
LTE Category M, a Cellular IoT standard included in LTE-Advanced Pro, is a wireless technology based on License Band LPWA in parallel with NB-IoT. As well as anticipated smart city and freight tracking applications, it is expected to be adopted by emergency warning systems due to its support for voice communications.
The measurement of LTE Cat-M devices can be automated using a program to control chipsets built into target devices, but, according to Anritsu, these programs required bespoke development for every customer.
Working closely with chipset vendors to establish measurement technologies for LTE Category M devices, Anritsu has been able to develop a turnkey solution to support automated evaluation for up to four LTE Category M devices and chipsets without requiring a customer-developed control program.
The Universal Wireless Test Set MT8870A is a measurement instrument for mass-production of various types of wireless communications equipment and modules. Four tester units are installed in the main unit and each unit supports parallel independent measurement for evaluation of up to four wireless devices and modules.
The MT8870A already fully supports 2G/3G/LTE/LTE-Advanced/NB-IoT, WLAN/Bluetooth, GPS, and FM evaluations.