Automatic test
In-situ and functional test solutions and Automated Test Equipements (ATE) :
• Manufacturing Defect Analyzer (MDA)
• In-Situ Testers (ICT), Functional (FT), Combined
• Optical Testers (AOI) – X-Ray Testers (AXI)
• Component Testers
• CompactPCI / PXI “configurable” testers
Automated test solutions are mainly used in production and maintenance. The market demands ever more efficient solutions at the best costs, able to adapt to constantly increasing production rates. The integration and complexity of manufactured products and their possible configuration during production phases require evolutionary test systems. As a result, testers now often include open and modular instruments and software.
Automatic test
August 2, 2017
NI’s ATE core configurations aim to lower cost of test systems
June 30, 2017
Marvin Test Solutions extends life of legacy semiconductor test systems
May 24, 2017
Astronics Test Systems introduces the ATS-3100 PXI Integration Platform
April 12, 2017
Chroma provides LabView toolkits for power conversion applications
February 28, 2017
Advantest launched the HF-AWGD module for its EVA100 measurement system
January 26, 2017
Pickering expands range of high-density 2 A PXI multiplexers
September 14, 2016
National Instruments announced TestStand 2016
September 6, 2016
Marvin Test Solutions expands TS-900 platform
May 17, 2016
Marvin Test Solutions expands Genasys Platform offerings
