integration approach, combining FormFactor's test stations and probing systems with RF measurement instruments developed by Rohde & Schwarz.

FormFactor and Rohde & Schwarz Strengthen Collaboration

  • American company FormFactor and German company Rohde & Schwarz have announced the expansion of their collaboration within the MeasureOne program, an initiative aimed at providing integrated solutions for the characterization of radio frequency components directly on the wafer.

This cooperation is based on a co-marketing and technology integration approach, combining FormFactor’s test stations and probing systems with RF measurement instruments developed by Rohde & Schwarz. The goal is to offer validated configurations covering the various phases of the development cycle, from initial validation to production stages.

RF Characterization on Wafer

Characterizing RF components at the wafer level allows for the evaluation of semiconductor component performance before encapsulation. This step is particularly relevant to applications such as 5G front-ends and RF filters. It enables the identification of defects upstream of the packaging phase, impacting production costs and yield.

In a context of increasing operating frequencies and the growing complexity of RF components, the need for integrated test solutions adapted to production environments is increasing. The collaboration between FormFactor and Rohde & Schwarz aims to address these constraints by offering systems that combine probing solutions and measurement instruments.

Test Equipment Integration

The solutions developed are based on the combination of probing stations, available in manual, semi-automated, or automated configurations, with RF measurement instruments such as vector network analyzers. These instruments include the R&S ZNA platform, used for measuring radio frequency parameters.

These instruments can be complemented by frequency converters to extend measurement ranges to higher frequency bands. Depending on the configuration, the systems also integrate test probe positioning devices, calibration tools, and thermal control functions.

The system is designed to enable measurements to be taken directly on silicon wafers, under conditions close to those of actual operation, with coordination between the hardware and software components provided by both companies.

Scope of the Collaboration

The partnership covers a wide range of measurement and signal generation equipment. It includes several families of vector network analyzers, as well as spectrum analyzers and signal generators. These instruments are integrated into the probe stations offered by FormFactor, including those for specific applications such as cryogenic or vacuum environments.
The integration of these systems aims to provide consistent configurations for the development and production phases, facilitating their deployment and use in industrial environments.