Automatic test
In-situ and functional test solutions and Automated Test Equipements (ATE) :
• Manufacturing Defect Analyzer (MDA)
• In-Situ Testers (ICT), Functional (FT), Combined
• Optical Testers (AOI) – X-Ray Testers (AXI)
• Component Testers
• CompactPCI / PXI “configurable” testers
Automated test solutions are mainly used in production and maintenance. The market demands ever more efficient solutions at the best costs, able to adapt to constantly increasing production rates. The integration and complexity of manufactured products and their possible configuration during production phases require evolutionary test systems. As a result, testers now often include open and modular instruments and software.
Automatic test
June 25, 2026
Seica Introduces the Opera Series: An Open Platform for Electronic Testing
June 24, 2026
Pickering Interfaces Expands its Line of Analog Output Modules in PXI and PXIe Formats
June 18, 2026
Teradyne and Tokyo Electron offer a test cell for AI chips
March 23, 2026
Teradyne Announces Omnyx PCB Test System
March 5, 2026
Pickering Launches Online Software Tool Designed to Accelerate and Simplify the Automated Test System Design Process
October 27, 2025
Pickering Fault Insertion Modules Leverage MEMS for MultiGBASE-T1 Testing
October 9, 2025
Spherea unveils the latest automated test bench in the Atec range
August 19, 2025
Pickering’s programmable resistor PXI modules provide voltage handling up to 1.2 kV
April 24, 2025
Seica to Present Two New Test Solutions at PCIM 2025
October 1, 2024
Pickering announces the latest version of its online RF and microwave switch design tool

