- Keysight Technologies has launched the XG7 series PSG analog signal generator, which incorporates two independent channels within a 2U chassis.
- Designed primarily for component testing in aerospace, defense, wireless technologies, and high-speed digital systems, this generator covers a frequency range of up to 20 GHz.
- It offers specified noise performance at a calibrated output power of up to +22 dBm.
The noise level of a signal generator is a critical parameter for component characterization, as imperfections in the test signal can mask specific behaviors of the device under test. The XG7 series PSG generator delivers a phase noise of -135 dBc/Hz and an amplitude modulation noise of -150 dBc/Hz, measured at 10 GHz with a 10 kHz offset. Its wideband noise floor reaches -166 dBc/Hz at 10 GHz.
The instrument is built on a hybrid architecture that features software-controlled mode switching, allowing its operation to be tailored to various test applications. Its calibrated output power—up to +22 dBm—also accounts for losses introduced by cables and test fixtures, ensuring the required signal level is delivered to the component being tested.
Two Independent Channels in a 2U Form Factor
Integrating two independent signal generation channels into a single chassis increases the number of available signals without requiring additional rack space. This configuration is particularly well-suited for test benches that demand multiple signal sources while minimizing equipment footprint.
Keysight has also ensured compatibility with the SCPI (Standard Commands for Programmable Instruments) control protocol, while maintaining rear-panel connections and parameter settings consistent with the previous generation. These features are designed to facilitate the reuse of existing automation scripts and test procedures when upgrading instruments.
The XG7 series PSG generator is therefore aimed at characterization environments where spectral purity, output level, and the integration density of signal sources are critical parameters.
