- On May 20, 2026, Rohde & Schwarz will hold the second edition of its virtual forum dedicated to innovations in radio frequency (RF) testing.
- This event brings together experts from Dassault Systèmes, FormFactor, and Focus Microwaves to address technical challenges related to the increasing frequencies of satellite communication systems and defense equipment.
Challenges in the Aerospace and Defense Component Market
The conference opening, led by Markus Loerner of Rohde & Schwarz, will address the transition of specialized components toward broader commercialization models. This shift is driven by the growing need for RF systems in the space and military sectors. The analysis will focus on comparing RF subsystems and establishing testing requirements aimed at reducing time-to-market cycles.
Absolute Phase Measurements and Calibration Methods
A technical segment will be devoted to absolute phase measurement across wide frequency bands, a factor sometimes overlooked in initial design phases. The presentation will detail phase calibration approaches, specifically the use of frequency comb generators and their traceability. Case studies will illustrate time-domain transformations, frequency converter validation, and specific considerations for vector network analyzers (VNA).
Sub-THz On-Wafer Characterization
With the emergence of multi-gigabit digital communications, engineers must extend S-parameter measurements to on-wafer environments. A live technical demonstration from the FormFactor laboratories in Dresden, Germany, will present protocols for achieving stable measurements in the D-band (up to 170 GHz). The use of an R&S ZNA analyzer equipped with frequency extenders will be showcased to illustrate the constraints inherent in on-wafer testing.
Noise Parameter Validation up to 67 GHz
The closing session will focus on noise measurement techniques in RF circuits, which are essential for low-noise amplifiers (LNA) used in LEO (Low Earth Orbit) satellites, remote sensing, and quantum computing. Since the LNA constitutes the first stage of a receiver, its noise characteristics determine the overall sensitivity of the system. The conference will detail the extraction of noise parameters via the “cold-source” method, performed with a vector network analyzer featuring specific noise figure measurement capabilities.
>> The event is accessible free of charge upon prior registration.
