Marvin Test Solutions has expanded the capabilities of its TS-900 PXI semiconductor test platform with the addition of the TS-960e system which offers PXI Express (PXIe) performance and expanded test capabilities for RF devices and SoC applications.
The TS-960e builds on the integrated open-architecture of the TS-900 platform and accommodates PXIe and PXI modules providing digital, mixed-signal, and RF test capabilities in a single chassis footprint.
The TS-960e platform combines 256, 125 MHz digital I/O channels with per-pin-PMU with multiple RF and analog test instruments in a single, 21-slot PXIe chassis. Available as a bench top or with an integrated manipulator, the TS-960e platform takes advantage of the PXIe architecture to achieve a full-featured test solution for digital, mixed–signal or RF test applications.
The GX5296 builds on the GX5295 digital subsystem and delivers digital test capabilities for addressing verification, focused production, and failure analysis test needs – or for replacing legacy test systems.
When combined with MTS’semiconductor software suite that includes program development and debug tools, file conversion tools for WGL, VCD/eVCD, STIL , and ATP formats, and semiconductor-specific test modules including Shmoo plots and IV curve, the TS-960e provides digital / mixed-signal / RF test capabilities for component, SoC and SiP devices.
The TS-960e is available with Keysight Technologies’ portfolio of PXIe RF instrumentation which can address a range of RF applications including WLAN, Bluetooth, Cellular, EW, and RF transceivers.
Available instrumentation options include Keysight Technologies’ vector transceiver, vector signal analyzers and generators, and vector network analyzer PXIe modules; offering wafer and packaged RF test capabilities from 9 KHz to 27 GHz.
All of these modules as well Keysight’s VSA measurement application software are integrated with the TS-960e’s system software, ATEasy.
