Keysight Technologies announced a broadband millimeter-wave network analyzer solution that delivers magnitude stability of less than 0.015 dB and phase stability of less than 0.15 degrees over a 24-hour period. This solution covers a frequency range from 900 MHz to 120 GHz.
The solution’s calibration capabilities are based on an improved-accuracy database that supports a 1.0 mm calibration kit (85059B) and a 1.0 mm verification kit (85059V). With this foundation, the new broadband millimeter-wave solution provides measurement results that are traceable to national metrology institutes.
Core elements of the system are a Keysight PNA or PNA-X network analyzer, along with N5293A Series compact frequency extenders and the N5292A test-set controller. To simplify benchtop measurements, it is possible to mount the frequency extenders on an optional desktop positioner.
Ruggedized 1.0 mm test ports ensure repeatable connections that improve calibration uncertainty and therefore system-level measurement precision. Users can apply automatic fixture de-embedding to connectorized measurements or perform calibration at the probe tips during on-wafer measurements.
Keysight collaborated with solution partner Cascade Microtech to provide a complete wafer measurement solution (WMS) based on the N5290/91A and the Keysight W8580BP WaferPro Express Core Measurement Bundle (software, drivers and database).
The broadband millimeter-wave solution also supports a variety of Keysight’s measurement applications : characterization of amplifiers and frequency converters (gain compression software option), measurements of mixers and frequency converters (scalar mixer software option), and calibrated multi-channel spectrum measurements (extended spectrum analyzer software option).
Keysight is also introducing a multi-touch user interface (UI) for all models in the PNA Series of network analyzers. Teh 12.1-inch display offers an easy access to frequently used functions, quick setups using touch-activated tabbed softkeys, and intuitive single- and multi-touch gestures to drag-and-drop or magnify traces.
