Rohde & Schwarz test solution for mmWave OTA measurement.

Rohde & Schwarz collaborates with MediaTek on the OTA test for 5G

  • Rohde & Schwarz collaborates with MediaTek on mmWave OTA measurement technologies to characterize antennas operated by next generation 5G mobile telecommunications equipment.

MediaTek develops electronic chips for RF communication that will be used by devices during the commercial deployment of future 5G mobile telecommunication networks that require specific technological developments such as massive MIMO antenna networks, dedicated signal processing algorithms and the implementation of OTA (Over-The-Air) tests.

In 5G communication systems using millimeter wave (mmWave) frequencies, there are risks such as path loss and shadow effects that can significantly reduce signal strength. To overcome this, MediaTek develops electronic chips that integrate beamforming antenna array design technology. To verify the quality and characteristics of each beam, it is necessary to have a test environment to measure multiple beam streams. MediaTek relies on the Rohde & Schwarz OTA solution for this.

Rohde & Schwarz offers a turnkey 5G mmWave OTA test solution. This solution includes the shielded RF test chamber of the R&S ATS series. This chamber, integrated in a 19-inch rack mounted on casters, has the appropriate supports for the units under test and sensors, and a broadband measurement antenna. Combined with the antenna measurement software, the radiation patterns of 5G antenna arrays can be measured according to Rohde & Schwarz in a few minutes. The R&S ATS1000 antenna characterization chamber covers a frequency band from 18 GHz to 87 GHz.

A positioning laser allows the precise orientation of the devices to be tested. The R&S SMW200A vector signal generator and the R&S FSW43 spectrum and signal analyzer have a frequency band up to 40 GHz and a modulation/demodulation bandwidth of 2 GHz. The R&S ZVA40 Vector Network Analyzer supports up to four independence signal sources for the four-port configuration allowing parallel signal output.