- Rohde & Schwarz will host a free online conference on May 5-6, 2026, entitled “From Design to Validation,” dedicated to power electronics.
- This event will bring together experts from industry and academia to discuss measurement and validation methods for modern power electronic systems, ranging from discrete components to grid-connected converters.
The power electronics market is facing increasing demands for energy efficiency, power density, and integration into large-scale power grids. Engineers must manage non-ideal component behavior, fast transient stresses on wide-bandgap devices (such as silicon carbide and gallium nitride), and increasingly stringent EMC (electromagnetic compatibility) requirements.
The conference will offer measurement-centric solutions implemented using tools such as oscilloscopes, vector network analyzers, and power analyzers.
Program and Presentations
May 5, 2026: The conference will open with a plenary lecture by Tobias Keller (Hitachi Energy), entitled “Power Semiconductors: Shaping the Future Power Grid – Performance and Reliability for Future Decades.” This presentation will address the qualification of silicon and silicon carbide (SiC) devices for high-voltage applications, with an emphasis on thermal cycling resistance, short-circuit robustness, and long-term reliability data.
May 6, 2026: A second plenary lecture will be presented by Veit Hellwig (Infineon Technologies), who will examine the impact of gallium nitride (GaN) technology on high-voltage inverter topologies for motors.
Other Technical Sessions Offered
- Characterization of Passive Components
One session will analyze methods for characterizing passive components, focusing on the extraction of parasitic inductances and capacitances at frequencies above 100 MHz. Speakers will demonstrate how these non-idealities influence converter stability. - Dynamic Characterization of SiC and GaN Devices
Another presentation will detail the automated dynamic characterization of SiC and GaN power devices. It will show how dual-pulse test benches can be synchronized with high-speed digitizers to reduce measurement uncertainty and capture fast recovery behaviors.
Two Sessions Dedicated to EMC
- Use of near-field probes to locate radiation sources and validate the effectiveness of EMI filters.
- Measurement of conducted emissions on a small-scale prototype, using a line impedance stabilization network (LISN) and a mixed-signal oscilloscope. Participants will discover a filter design methodology that leverages the instrument’s time-frequency capabilities.
Energy Efficiency Measurement
A webinar will cover efficiency measurements in data center and AI server power supplies. Participants will learn how power analyzers can track distorted waveforms and fast load transients to meet 80 Plus certification requirements.
Flicker and Harmonic Compliance
The final session will focus on compliance with harmonic current and voltage flicker standards for products connected to the low-voltage grid. The limits and test procedures defined in IEC/EN 61000-3-2/-3-3 and IEC/EN 61000-3-12/-3-11 will be reviewed. Participants will discover how integrated compliance testing software, coupled with a power analyzer, can automate compliance decisions, from prototype evaluation to final approval.
Speaker Profiles
The speakers at this event are experts from Rohde & Schwarz, Hitachi, Infineon, PE-Systems, and Würth Elektronik, as well as representatives from the Universities of Bremen and Zaragoza. Their contributions will combine academic perspectives with industry experience, providing participants with both theoretical foundations and practical measurement strategies.
Practical Information
The conference is free, but prior registration is required. The detailed program, speaker biographies, and registration link are available at: www.rohde-schwarz.com/power-electronics-conference
