Keysight 100GE UHD100T32 Test System.

Keysight offers a 100 Gigabit Ethernet network testing solution

  • The UHD100T32 test system from Keysight Technologies enables pre- and post-deployment testing of 100 Gigabit Ethernet equipment and networks.

Keysight Technologies announced the UHD100T32 100 Gigabit Ethernet (GE) test system, specifically designed to help data center operators and network equipment manufacturers meet the density and cost per bit challenges of validating 100GE components and networks.

With mass deployment in modern data centers, 100GE technologies have matured. Cloud service providers, communications service providers and network equipment manufacturers are now challenged with density and cost pressures on their test infrastructure. This typically leads to a compromise in testing cycles and the use of test systems and methodologies that don’t allow for comprehensive quality control.

Keysight’s new UHD100T32 test system, co-developed with Barefoot Networks, an Intel company, is purpose-built to meet the requirements of the modern networking infrastructure ecosystem. In a 1U box, users get the power of 3.2 Tbps of line-rate test traffic from 32 ports of 100GE, a requirement to validate the performance of ultra-high-density devices like those found in today’s data centers and in manufacturing use cases for full box tests in production lines.

With all fan-out speeds (50/40/25/10GE) enabled, UHD100T32 has the flexibility to test all speeds in a data center fabric. It also includes Keysight’s technology for Layer 2/3 traffic generation and analysis and RFC 2544 tests for benchmarking throughput and latency of devices.

Optional routing protocols are available for Open Shortest Path First (OSPF), Border Gateway Protocol (BGP), and Intermediate System to Intermediate System (ISIS) that allow users to emulate from control plane to data plane for convergence testing. A clientless operation via web interface and modern “Representational State Transfer” (REST) application programming interface (API) enable faster time to test and easy automation.