Tektronix’s Keithley 2601B-Pulse Sourcemeter

Lukasiewicz Research Network opts for Tektronix oscilloscopes and Keithley source meters

  • The Lukasiewicz Research Network – Institute of Microelectronics and Photonics has opted for instruments from Tektronix and Keithley to study the current and voltage characteristics of wide bandgap semiconductors.

Based in Warsaw, Poland, the Lukasiewicz – Institute of Microelectronics and Photonics conducts scientific research and development in areas such as micro and nanoelectronics, optoelectronics, materials engineering and power electronics.

In a recent project, the institute sought to develop a new generation of innovative devices and materials based on wide-bandgap semiconductors such as GaN, SiC, Ga2O3 and others for power electronic systems, specifically targeting those for fast-charging stations for electric car batteries.

“The biggest challenge of the project was meeting the stringent requirements for system functionality and flexibility when measuring semiconductor devices, which came in the form of TO-220 and TO-247 chips-on-wafers and packages. The project also required the implementation of a variety of test procedures with some current measurements in the femto ampere range,” said Andrzej Taube of the Institute of Microelectronics and Photonics in Lukasiewicz.

In addition, the dynamic characterization of GaN power semiconductor circuits has its own peculiarities compared to other semiconductors. This involves a complex test setup to recover key data such as dynamic RDS (on) (Drain-source on-state resistance) or the value of capacitance between terminals. The customer also specified the need to ensure automatic switching of high voltage and high current measurements without rewiring. This Tektronix instrumentation was able to provide.

The Lukasiewicz – IMiF chose 2600 series source meters to measure current-voltage characteristics over a wide range of voltages (up to 3kV) and currents from the femto ampere range up to 50A. This series of source meters is specifically designed to characterize and test high voltage/current power and electronic semiconductors, such as diodes, FETs and IGBTs, high brightness LEDs and DC-DC converters.

In addition, the 2600 series source meters, along with an ATV HV switch and Tektronix MDO3034 digital oscilloscopes, will be used to meet the dynamic RDS (on) measurement needs of GaN power transistors.

Tektronix not only provided instruments to the Institute, but also advised the researchers on relevant measurement techniques. Dr. inż. Taube said, “We received technical advice to make measurements of very low current levels (below 10-14 A) with appropriate resolution.”

Dr. Eng. A.Taube continued: “I can definitely recommend the Tektronix and Keithley instruments because of the wide measurement ranges of various electrical quantities, a unique wide range of measurement procedures offered and their ease of use and configuration. They also offer the flexibility to expand the system with new measurement possibilities in the future. Their good price/performance ratio is accompanied by responsive technical support.”

The purchase of the measurement system was financed under the project: “Center for Nanoelectronics, Microsystems and Photonics” (contract number: RPMA.01.01.00-14-9873/17-00) co-financed by the European Regional Development Fund under: Priority axis I”. The use of research and development activities in the economy” Measure 1.1 “Research and development activity of scientific units” of the Regional Operational Program for the Mazowieckie Voivodeship 2014-2020.