- Pickering Interfaces, a provider of modular switching and signal simulation solutions for electronic test and verification, has announced a new range of high-density, two-pole PXI switching matrices.
The 40-580 (32×8) and 40-583 (64×4) series matrices are supported by the two Pickering test tools (BIRST and eBIRST) allowing in-depth diagnosis of relays and identification of relays approaching their end of life or those that may have been damaged by hot switching beyond their specifications.
Featuring 256 2-pole crossing points, these matrices include electromechanical relays with gold-plated contacts supporting switching voltages up to 300VDC/250VAC and up to 60W of power. They can withstand a maximum current of 2A in hot or cold switching. The signals are connected via Sub D 78 or DIN 160 connectors.
These matrices, in 3U format and occupying a single PXI slot, can be used in any PXI or PXIe Hybrid chassis, as well as in Pickering’s LXI and LXI/USB chassis.
The integrated BIRST self-test solution makes it easy to identify faulty relays. No additional test equipment is required. Simply disconnect the cable from the front of the card, launch the BIRST application and the tool will run a diagnostic test to identify relays with defective contacts. In addition, the external eBIRST test tools test the front panel connections and simplify troubleshooting by providing a graphical display of the positioning of defective relays.
These new models, with a three-year warranty, complement the existing 40-582 (16×16) matrix. They are provided with drivers compatible with various programming languages.