Keithley 4200A-SCS parameter analyzer.

SMU modules for the Keithley 4200A-SCS parameter analyzer adapt to high connection capacities

  • Tektronix announces two new SMU (Source Measuring Unit) modules for the Keithley 4200A-SCS parameter analyzer.
  • These modules are able to perform low-current measurements even under high-capacity load due to long cables and other complex test configurations.

The 4201-SMU and 4211-SMU modules are intended to be integrated with the Keithley 4200A-SCS Analyzer’s semiconductor parameter analyzer. They are specially designed for test configurations involving long cables, switch matrices, and other mounting interfaces. Such test configurations used in low-current measurement applications can increase the observed capacity at the output of the SMU, even if the device under test itself has a very low capacity. A too high capacity of the test links is too high, however, leads to instability of the low-level current measurements.

To overcome this problem, the new modules are able to deliver voltage and measure current via longer cable lengths or higher connection capacity than traditional SMUs.

According to Tektronix, over the lowest current measurement range, the 4201-SMU and 4211-SMU can power and measure a system 1000 times more capacitive than what was possible until now. The new Keithley modules are distinguished by their measurement stability with a capacity load of up to 1 µF.

The 4201-SMU and 4211-SMU can be integrated into an existing 4200A-SCS parameter analyzer without requiring it to be returned to the Tektronix service center.

The 4200A-SCS is a modular and integrated parameter analyzer for the electrical characterization of semiconductor materials and components. It makes it possible to synchronously measure changes in current according to voltage (I-V), capacitance according to voltage (C-V) and to characterize the behaviour of components at current and voltage pulses. An analyzer can receive up to nine SMUs. It is equipped with a touch screen for test configuration, parameter analysis, and graph editing. Characterization procedures for semiconductors and other materials can be automated.