Marvin Test Solutions TS-960e PXI test system

Solutions presented by Marvin Test Solutions at IEEE Autotestcon 2019

  • IEEE Autotestcon 2019 will be held from 26 to 29 August at the Gaylord National Hotel & Convention Center in National Harbor, MD.
  • Marvin Test Solutions (MTS) will present its range of test solutions for the aeronautics and military sectors.

IEEE Autotestcon is a test and measurement conference that brings together the military/aerospace automatic test industry and government/military acquirers and users to share new technologies, discuss innovative applications, and demonstrate their products and services.

# MTS will display its range of test solutions for mil/aero applications :

  • Integrated Test Executive / Test Development Environment (IDE) with enhanced cybersecurity features – ATEasy X
  • Universal O-Level armament test set for legacy and “smart” MIL-STD-1760-based weapon systems – MTS-3060A SmartCan
  • Ultra-rugged I-Level test sets supporting multiple weapon systems platforms
  • PXI / PXIe instrumentation and switching, chassis and sub-system solutions – PXI/PXIe Products
  • FFF (Form/Fit/Function) alternatives for obsolete, legacy instrumentation – GP Series
  • Semiconductor Test System with multi-port, mmWave RF test capabilities and timing per pin digital subsystem – TS-960e Series

# In addition to the exhibition, MTS will participate in the technical program, presenting or co-presenting these papers:

  • Countering Cybersecurity and Counterfeit Material Threats in Test Systems
  • Addressing ATE Instrument Obsolescence with Form / Fit / Function Compatible Solutions – A Case Study
  • The PXI Standard – A Summary of Updates and Enhancements to the PXI Specifications