SMU AQ23011A from Yokogawa

Yokogawa offers the modular AQ2300 series source and measurement unit

  • Yokogawa’s AQ2300 series source and measurement unit is distinguished by its modular, scalable architecture.
  • Featuring a color touch screen, this solution integrates a chassis that can accommodate up to nine voltage and current (±6 V/±600 mA) source and measurement modules, depending on the version.
  • The Source Measure Unit (SMU) is available in two versions, AQ23011A and AQ23012A, which can accommodate 3 or 9 SMU modules respectively. Each module has two channels and a trigger input for each channel.

 
Each of the two channels of the SMU module (part no. AQ23811A) can measure voltages and currents with a minimum resolution of 100 μV/1pA and deliver voltages and currents with a resolution of 100 μV/1 pA. Accuracy is ±0.02% in voltage and ±0.03% (20 μA to 200 mA range) in current.

For each channel, the user can select the option of simultaneous voltage and current measurement.

Waveforms can be output in several formats: continuous, pulse, linear sweep, logarithmic sweep and programmed sweep. Pulse width is adjustable from 50µs to 1 second.

SMU AQ23011A and AQ23012A from Yokogawa.
Models AQ23011A and AQ23012A can integrate three and nine two-channel SMU modules respectively.

The SMU modules feature trigger ports on the chassis as well as on each module. What’s more, the synchronization function on the chassis allows you to choose the connection method best suited to your test application. Three trigger synchronization modes are available: chassis synchronization with external equipment, SMU channel synchronization with external equipment, and synchronization between SMU channels.

The AQ2300 series source and measurement unit is suitable for various applications such as :

  • Static testing of laser diode modules: the source meter can generate different voltages or currents from several channels, and use the scan synchronization function to measure the I/V or I/L characteristics of optical communication components such as laser diodes.
  • Testing the filter characteristics of WDM (wavelength division multiplexing) photodiode modules: the source and meter unit can generate different voltages or currents from several WDM channels and use the scan synchronization function to measure the filter characteristics of each individual channel.