Marvin Test Solutions TS-960e PXI test system

Marvin Test Solutions presents its test solutions at Semicon West 2019


  • Marvin Test Solutions (MTS) invites you to discover its solutions on its stand at Semicon West at the Moscone Center in San Francisco, July 9 – 11 to learn more about its suite of open-architecture semiconductor test solutions, delivering value, performance, and advanced test capabilities.

The TS-960e Series Semiconductor Test System offers ATE capability in a small footprint. With a comprehensive suite of software tools and timing and PMU per pin capability with sub-nanosecond edge placement resolution, the TS-960e is designed to support both engineering and production environments.

For RF test applications, the TS-960e is available with a portfolio of PXIe RF instrumentation.

MTS will demonstrate a solution its latest solution for 5G applications: a multi-port, multi-site system for testing of mmWave beamforming devices.